Yes. We support retail, small batch stock orders and bulk wholesale for all standard test probe models with fast delivery.

Yes. Our coaxial pogo pins are specially designed for high-frequency signal testing, maintaining complete signal integrity for 5G, AI and high-performance computing devices.

We supply multiple tip types including dome tip, sharp tip, spear tip, flat tip and stepped tip to match different pad designs and testing requirements.

Yes. We provide high temperature resistant pogo pins and guide pins that adapt to high and low temperature cycling environments for automotive and aerospace testing equipment.

Most of our regular test probes feature low contact resistance below 2mΩ. High-current customized probes can reach contact resistance lower than 1mΩ for high-precision power testing.

Our standard spring loaded test probes support more than 1 million compression cycles. High-grade industrial probes can maintain stable contact performance for long-term repeated testing.

Testing stability depends on pin material, gold plating thickness, contact resistance, spring elasticity and working travel. High-quality materials and precise manufacturing ensure stable signal transmission.

Test probes are widely used in PCB ICT/FCT testing, automotive electronics, EV battery BMS testing, semiconductor packaging, 5G communication equipment and industrial fixture testing systems.

Our main product series include standard spring test probes, high-current pogo pins, fine-pitch semiconductor probes, coaxial high-frequency probes and temperature sensing probes, covering most electronic testing scenarios.

A spring loaded test probe, also known as a pogo pin, is a precision spring contact component used for electrical testing. It provides stable conductivity, flexible compression and consistent contact for PCB, semiconductor and industrial testing equipment.