SF-PM200 is a spring-loaded test probe designed for PCB and electronic testing applications, featuring 12.0mm full travel, 300g spring force, a 5A current rating, and 50mΩ contact resistance.

SF-PH18 is a high-performance spring-loaded ICT test probe featuring 5A current capacity, 300g spring force, and reliable electrical contact for professional PCB testing applications.

The SF-PM200 is a high-performance spring-loaded test probe featuring a 2.54mm recommended minimum center, 12.0mm full travel, and a robust 5A current rating, designed for demanding ICT and FCT fixture testing applications.

Featuring gold-plated conductive needles and multiple tip designs, this multi-tip pogo pin connector is engineered for high-reliability PCB testing, electronic component interconnects, and ICT fixture applications.

Engineered for high-density testing and fine-pitch accuracy, our P100 series spring-loaded ICT test probes deliver superior conductivity, low contact resistance, and exceptional durability for all board fixture applications.

2026 new‑release 33mm gold‑plated pogo pin is spring‑loaded test probe specially for FCT board test fixtures. Brass barrel and beryllium‑copper plunger with full gold‑plated finish deliver low contact resistance and anti‑oxidation performance. Stainless‑steel spring ensures stable spring force for repeated mass‑production testing. Standard 33mm size in‑stock; OEM customization for tip style, spring force and plating thickness is supported. RoHS & ISO9001 compliant, samples available for evaluation.

Precision SF-PH-6 spring contact probe featuring a robust 250g spring force, 10.5 full travel, and reliable brass/phosphor copper construction, engineered for professional electronic and ICT testing.