The SF5724 spring test probe features a 3A current rating, contact resistance ≤ 50mΩ, 4.0mm full travel, and 200g spring force, engineered for reliable electronic and PCB testing applications.

The SF55-6-23-180A is a heavy-duty high-current test clamp featuring a Beryllium Copper (BeCu) conductor sheet, PPS1140 insulating housing, and functional gold plating rated for up to 180A continuous current and a lifespan $\ge$ 30,000 cycles.

The SF30-5-23-60A soft pack battery clip features durable brass construction with Au plating over nickel, engineered to deliver stable 60A high-current transmission for battery testing and electronic interconnect applications.

Featuring a high-durability brass barrel, stainless steel spring, and gold-plated finish (Au 15u"/5u" with Ni underplating), this spring-loaded pogo pin connector is engineered for reliable charging, data transfer, and electronic device testing.

Featuring gold-plated brass construction (Au 3u" on plunger and barrel over 50-120u" Ni), a mechanical durability of $\ge$10,000 cycles, and a 60g spring force, this high-performance spring probe is engineered for reliable ICT/FCT testing and temporary PCB interconnects.

The SF-PM200 is a high-performance spring-loaded test probe featuring a 2.54mm recommended minimum center, 12.0mm full travel, and a robust 5A current rating, designed for demanding ICT and FCT fixture testing applications.

Featuring gold-plated conductive needles and multiple tip designs, this multi-tip pogo pin connector is engineered for high-reliability PCB testing, electronic component interconnects, and ICT fixture applications.

Precision spring-loaded pogo pins ensure reliable, reproducible contacts in PCB test jigs, supporting custom dimensions, materials and spring force tailored to your use case.

The P020 gold-plated spring-loaded PCB test probe features multiple tip options, low contact resistance, and exceptional mechanical durability for fine-pitch ICT, FCT, and circuit board testing fixtures.

The P060 spring-loaded test needle is designed for precision PCB and loaded-board ICT testing, providing consistent spring tension, low contact resistance, and exceptional durability across high-volume production lines.

The SFENG PL50 is a high-precision spring-loaded test fixture probe engineered for reliable PCB and ICT board testing, featuring fine-pitch accuracy, low contact resistance, and long mechanical lifespan.

Featuring a 1.27mm recommended minimum center, SK4 Ni/Au plated plungers, and stainless steel springs, this high-quality gold-plated PCB spring test probe pin is engineered for gentle, non-destructive contact on PCB gold fingers, pads, and ICT test fixtures.