The P020 gold-plated spring-loaded PCB test probe features multiple tip options, low contact resistance, and exceptional mechanical durability for fine-pitch ICT, FCT, and circuit board testing fixtures.

The SFENG PL50 is a high-precision spring-loaded test fixture probe engineered for reliable PCB and ICT board testing, featuring fine-pitch accuracy, low contact resistance, and long mechanical lifespan.

Featuring a 1.27mm recommended minimum center, SK4 Ni/Au plated plungers, and stainless steel springs, this high-quality gold-plated PCB spring test probe pin is engineered for gentle, non-destructive contact on PCB gold fingers, pads, and ICT test fixtures.

SFENG provides premium spring-loaded test pins and pogo pin accessories backed by decades of manufacturing expertise since 1984, offering reliable low MOQ options and precision testing solutions for global electronics applications.

The SF-P100 is a high-performance spring-loaded test probe featuring a 1.90mm recommended minimum center, 6.30mm full travel, 3A current rating, and rh-plated BeCu plungers with gold-plated brass barrels, built for demanding PCB and ICT fixture testing.

Engineered for high-density testing and fine-pitch accuracy, our P100 series spring-loaded ICT test probes deliver superior conductivity, low contact resistance, and exceptional durability for all board fixture applications.