Featuring gold-plated conductive needles and multiple tip designs, this multi-tip pogo pin connector is engineered for high-reliability PCB testing, electronic component interconnects, and ICT fixture applications.

The P020 gold-plated spring-loaded PCB test probe features multiple tip options, low contact resistance, and exceptional mechanical durability for fine-pitch ICT, FCT, and circuit board testing fixtures.

The P060 spring-loaded test needle is designed for precision PCB and loaded-board ICT testing, providing consistent spring tension, low contact resistance, and exceptional durability across high-volume production lines.

The SFENG PL50 is a high-precision spring-loaded test fixture probe engineered for reliable PCB and ICT board testing, featuring fine-pitch accuracy, low contact resistance, and long mechanical lifespan.

Featuring a 1.27mm recommended minimum center, SK4 Ni/Au plated plungers, and stainless steel springs, this high-quality gold-plated PCB spring test probe pin is engineered for gentle, non-destructive contact on PCB gold fingers, pads, and ICT test fixtures.

The SF-P100 is a high-performance spring-loaded test probe featuring a 1.90mm recommended minimum center, 6.30mm full travel, 3A current rating, and rh-plated BeCu plungers with gold-plated brass barrels, built for demanding PCB and ICT fixture testing.

The SF-P75 is a high-precision spring-loaded test probe featuring a 1.90mm recommended minimum center, 3A current rating, and durable BeCu/SK4 plungers with gold-plated phosphor bronze barrels, tailored specifically for reliable PCB, ICT, and FCT fixture testing.

SFENG SF-P75 high precision spring loaded test probe features stable contact resistance of 50mΩ and 3A current rating, widely used for PCB & ICT testing; we support OEM customization with fast delivery and bulk wholesale supply.

2026 new‑release 33mm gold‑plated pogo pin is spring‑loaded test probe specially for FCT board test fixtures. Brass barrel and beryllium‑copper plunger with full gold‑plated finish deliver low contact resistance and anti‑oxidation performance. Stainless‑steel spring ensures stable spring force for repeated mass‑production testing. Standard 33mm size in‑stock; OEM customization for tip style, spring force and plating thickness is supported. RoHS & ISO9001 compliant, samples available for evaluation.

Factory‑sales Be‑Cu round‑tip pogo pin is premium spring‑loaded FCT test probe. Beryllium‑copper round‑tip delivers good elasticity, low contact resistance and less scratch on PCB pads. Gold‑plated surface improves anti‑oxidation and service life for mass‑production fixture testing. Standard sizes in‑stock. Custom length, spring force and plating thickness are supported. RoHS & ISO9001 compliant, samples are available.

SFENG hot‑sale ICT spring‑loaded test probes are in‑stock standard spring probes for PCB in‑circuit test fixtures. Gold‑plated construction delivers low contact‑resistance and stable signal transmission for mass‑production PCBA testing. Multiple tip styles and sizes are readily available. Custom spring force, length and plating are supported. RoHS & ISO9001 compliant, samples are offered for evaluation.

Brand:SFENG
Item number:SF5880
Size: dia2.0*L24.5mm
Plunger:SK4
Barrel:Brass
Spring:SUS
Finish:Au on Ni plated
Packing:Plastic bag and loaded into carton box