Precision SF-PH-6 spring contact probe featuring a robust 250g spring force, 10.5 full travel, and reliable brass/phosphor copper construction, engineered for professional electronic and ICT testing.

Precision SF-P75-J spring test probe featuring a 1.90mm pitch, 120g spring force, and 3A current rating, engineered for reliable electronic and PCB inspection.

Precision SF-P040 spring test probe featuring a fine 0.8mm pitch, 0.55mm mounting hole, 40g spring force, and 0.5A current rating, engineered for reliable electronic and PCB inspection.

Precision PCB test sharp tip test probe SF-PA100-B featuring flexible material choices (Bronze, Brass, or BeCu plunger, gold/nickel-plated barrel, and stainless steel or music wire spring) for reliable electronic testing.

Factory direct sale spring loaded pins designed for high-performance PCB testing, offering exceptional durability, international standard compliance (ISO9001 and RoHS), and reliable electrical contact.

The SF5724 spring test probe features a 3A current rating, contact resistance ≤ 50mΩ, 4.0mm full travel, and 200g spring force, engineered for reliable electronic and PCB testing applications.

The SF55-6-23-180A is a heavy-duty high-current test clamp featuring a Beryllium Copper (BeCu) conductor sheet, PPS1140 insulating housing, and functional gold plating rated for up to 180A continuous current and a lifespan $\ge$ 30,000 cycles.

Featuring gold-plated brass construction (Au 3u" on plunger and barrel over 50-120u" Ni), a mechanical durability of $\ge$10,000 cycles, and a 60g spring force, this high-performance spring probe is engineered for reliable ICT/FCT testing and temporary PCB interconnects.

The SF-PM200 is a high-performance spring-loaded test probe featuring a 2.54mm recommended minimum center, 12.0mm full travel, and a robust 5A current rating, designed for demanding ICT and FCT fixture testing applications.

The P060 spring-loaded test needle is designed for precision PCB and loaded-board ICT testing, providing consistent spring tension, low contact resistance, and exceptional durability across high-volume production lines.

Featuring a 1.27mm recommended minimum center, SK4 Ni/Au plated plungers, and stainless steel springs, this high-quality gold-plated PCB spring test probe pin is engineered for gentle, non-destructive contact on PCB gold fingers, pads, and ICT test fixtures.

The SF-P100 is a high-performance spring-loaded test probe featuring a 1.90mm recommended minimum center, 6.30mm full travel, 3A current rating, and rh-plated BeCu plungers with gold-plated brass barrels, built for demanding PCB and ICT fixture testing.