SFENG provides premium spring-loaded test pins and pogo pin accessories backed by decades of manufacturing expertise since 1984, offering reliable low MOQ options and precision testing solutions for global electronics applications.

The SF-P100 is a high-performance spring-loaded test probe featuring a 1.90mm recommended minimum center, 6.30mm full travel, 3A current rating, and rh-plated BeCu plungers with gold-plated brass barrels, built for demanding PCB and ICT fixture testing.

The SF-P75 is a high-precision spring-loaded test probe featuring a 1.90mm recommended minimum center, 3A current rating, and durable BeCu/SK4 plungers with gold-plated phosphor bronze barrels, tailored specifically for reliable PCB, ICT, and FCT fixture testing.

SFENG SF-P75 high precision spring loaded test probe features stable contact resistance of 50mΩ and 3A current rating, widely used for PCB & ICT testing; we support OEM customization with fast delivery and bulk wholesale supply.

Engineered for high-density testing and fine-pitch accuracy, our P100 series spring-loaded ICT test probes deliver superior conductivity, low contact resistance, and exceptional durability for all board fixture applications.

SFENG spring‑loaded guide pins are precision positioning parts for PCB ICT & FCT test fixtures. Made of brass housing with nickel‑plated finish and stainless‑steel spring, they accurately align PCBs, avoid board offset and protect test probes during mass testing.

Brass positioning guide pins are precision locating components for PCB ICT and FCT test fixtures. Nickel‑plated brass construction ensures stable positioning for PCBA boards, preventing offset and protecting test probes. Factory wholesale, standard sizes in‑stock. Custom dimensions are supported. RoHS & ISO9001 compliant, sample available.

SFENG screw-in test probes deliver reliable electrical contact, outstanding durability, and anti-loosening precision through high-quality gold-plated brass/beryllium copper construction—providing a cost-effective testing solution for PCB and electronic component inspection.

75mil & 100mil screw‑in test probes are threaded spring‑loaded contact pins specially for cable harness and connector cable‑table testing. Thread‑locking design prevents loosening during continuous vibration. Gold‑plated tips deliver low contact‑resistance and long service cycles. Standard sizes in stock; custom tip, spring force and thread specs are supported. RoHS & ISO9001 compliant, samples available for evaluation.

Factory‑direct 3A ICT switch probe is normally‑open spring‑loaded switch pin for ICT/FCT test fixtures. It triggers circuit closing at designated travel to detect PCB or component presence, rated 3A current with gold‑plated contact for low contact resistance. PEEK insulating sleeve ensures reliable insulation. Standard sizes in stock, custom switching travel, spring force and length available. RoHS & ISO9001 compliant, samples for evaluation are offered.

Ni‑plated PCB spring‑loaded contacts are cost‑effective spring contact components for PCB test fixtures and electronic assembly. Nickel‑plated surface delivers good anti‑oxidation performance and stable electrical connection. The built‑in spring absorbs assembly tolerance for repeatable contact performance. Standard sizes in stock. Custom length, spring force and plating options are supported. RoHS & ISO9001 compliant, samples are available.

60A double‑side clamp with cable is high‑current test fixture for lithium‑battery cell testing. Double‑sided clamping design ensures firm contact; matched high‑current wire supports max 60A continuous test current. Low‑resistance contact helps accurate battery performance test. Custom clamp size, cable length and terminal types are available. RoHS & ISO9001 compliant, samples are offered for evaluation.