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High Performance SFENG PCB and ICT Test Probe Pin Receptacles for Circuit Testing
SFENG provides premium spring-loaded test pins and pogo pin accessories backed by decades of manufacturing expertise since 1984, offering reliable low MOQ options and precision testing solutions for global electronics applications.
Hot Tags : High Current Compression Spring Test Probe Pin High Cycle Durable Contact Probe Pin Flexible Compression Spring Test Probe Pin
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High Performance SFENG SF-P100 Gold Plated PCB Test Probe Pin for In-Circuit Test
The SF-P100 is a high-performance spring-loaded test probe featuring a 1.90mm recommended minimum center, 6.30mm full travel, 3A current rating, and rh-plated BeCu plungers with gold-plated brass barrels, built for demanding PCB and ICT fixture testing.
Hot Tags : Fine Pitch PCB ICT Test Probe High Current Compression Spring Test Probe Pin Mass Production ICT PCB In-Circuit Test Probe
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SFENG SF-P160 High-Performance Spring Test Probe Pin for ICT/FCT Fixtures
The SF-P75 is a high-precision spring-loaded test probe featuring a 1.90mm recommended minimum center, 3A current rating, and durable BeCu/SK4 plungers with gold-plated phosphor bronze barrels, tailored specifically for reliable PCB, ICT, and FCT fixture testing.
Hot Tags : Mass Production ICT PCB In-Circuit Test Probe Fine Pitch PCB ICT Test Probe
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SFENG SF-P75 PCB ICT Spring Loaded Probe, Bulk Wholesale Pricing
SFENG SF-P75 high precision spring loaded test probe features stable contact resistance of 50mΩ and 3A current rating, widely used for PCB & ICT testing; we support OEM customization with fast delivery and bulk wholesale supply.
Hot Tags : Fine Pitch PCB ICT Test Probe Mass Production ICT PCB In-Circuit Test Probe
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PCB test probe low price china supplier spring loaded probe pin SF-PA160-LM2.0
Brand:SFENG
Item number:SF5880
Size: dia2.0*L24.5mm
Plunger:SK4
Barrel:Brass
Spring:SUS
Finish:Au on Ni plated
Packing:Plastic bag and loaded into carton boxHot Tags : Mass Production ICT PCB In-Circuit Test Probe Fine Pitch PCB ICT Test Probe
